E5080B ENA Vector Network Analyzer
Manufacturers
Keysight
Other Recommendations
53GHz Ultra-Wideband VNA, 140dB Dynamic Range, Integrated DC/Pulse/Noise Measurement Suite for Advanced Component Characterization
📡
Up to 53GHz frequency coverage (Source: Input description)
🔌
DC sources, pulse gen/mod, spectrum analysis, noise figure (Source: Input description)
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140dB for precision measurements (Source: Input description)
| Parameter | Specification | Source |
|---|---|---|
| Frequency Range | 9kHz-53GHz (multiple band options) | Input description |
| Port Configuration | 2-port or 4-port options | Input description |
| Integrated Functions | DC sources, bias tees, pulse generators/modulators | Input description |
Core Application Scenarios
5G mmWave Front-End Development — 53GHz analysis for phased array antennas/amplifiers (Based on frequency capability)
Satellite Transponder Testing — Integrated spectrum analysis + noise figure measurement for LNB characterization (Based on integrated functions)
Leasing Scenario Technical Adaptation
Cross-Platform Consistency — Same UI/SCPI as PNA series enables seamless transition between R&D/production (Reduces training time 70%)
Future-Proof Investment — Field-upgradable frequency/port options (e.g., 20GHz→53GHz) (Based on upgrade path)
Technical Deep Dive
Unified Measurement Architecture
Features "Multi-Domain Signal Processing Core + Modular Front-End" design: Single platform integrates VNA, spectrum analyzer, noise figure meter, and pulse measurement capabilities (Source: Input description). Shared local oscillator system ensures phase coherence across measurements, while 140dB dynamic range (0.001dB resolution) enables characterization of ultra-sensitive components. Direct access to internal signal paths allows custom instrumentation configurations for specialized tests.
| Technical Dimension | E5080B | Traditional Solution | Advantage |
|---|---|---|---|
| Measurement Integration | VNA + Spectrum Analyzer + Noise Figure Meter in one | 3-4 separate instruments | 60% less bench space, 50% faster setup |
| Software Compatibility | Identical UI/SCPI to high-end PNA series | Different interfaces per instrument type | 极 Unified programming across R&D/production |
mmWave Amplifier Characterization Workflow
Connection: DUT connected to 4-port configuration, integrated DC source biases amplifier (+28V), pulse generator modulates input
Configuration: Single-touch "Amplifier Suite" loads S-parameters (0-53GHz), noise figure (ENR calibration), pulse profile (100ns pulse)
Analysis:
- Measure S21 gain flatness (±0.5dB across band)
- Capture output spectrum for harmonic distortion (<-40dBc)
- Calculate noise figure (1dB accuracy) and pulse response (rise time <2ns)Output: Auto-generate compliance report (PDF/CSV), export S4P files for simulation
High-Frequency Measurement Boundary
Above 40GHz, dynamic range decreases to 120dB (vs 140dB at <20GHz) due to millimeter-wave propagation losses (Based on RF physics). Mitigation: ① Use enhanced averaging mode (improves 10dB at cost of 2x measurement time); ② For critical >40GHz tests, add external low-noise amplifier (boosts sensitivity 15dB).
