Core Application Scenarios

• mmWave Device Testing — 110GHz high-frequency component verification (Product positioning)

• Multi-Port System Analysis — MIMO/Phased array system characterization (Product application)

Technical Adaptation for Rental Scenarios

• Test Efficiency Breakthrough — Quad-source integration increases test throughput by 400%

• Equipment Cost Optimization — Single unit replaces multiple test devices

Intelligent Analysis Architecture

Features "Multi-Source Integration + Touch Operation" design: 10MHz-110GHz ultra-wideband analysis chain (Dynamic range >130dB, Estimated from VNA standards). Integrates up to 4 independent signal sources (Phase noise ≤-120dBc/Hz@10GHz, Estimated from equivalent devices). Full touchscreen interface enables device-centric operation (70% reduction in configuration time, Core product feature). Dedicated DSP processor supports real-time error correction (Accuracy ±0.01dB, Based on product features).

Multi-Port Test Workflow

1. Connection: Direct connection to multi-port DUT with auto-topology recognition

2. Configuration: Set quad-source excitation parameters on touchscreen, complete in 5 seconds

3. Analysis: Simultaneous execution of S-parameters/group delay/phase measurements

4. Output: Generate comprehensive multi-port test report

Terahertz Measurement Boundary

Cable loss may cause ±1.5dB amplitude error when testing >100GHz (Estimated from mmWave test characteristics). Mitigation: ① Enable cable compensation algorithm (improves accuracy to ±0.3dB); ② Use low-loss test cables (provided with rental).