Core Application Scenarios

• RF Component Development — Amplifier/filter/mixer testing (Product positioning)

• High-Speed PCB Design — Microwave circuit board verification (Product application)

Technical Adaptation for Rental Scenarios

• Test Efficiency Breakthrough — Ultra-fast scanning increases test throughput by 450%

• Equipment Cost Optimization — Single unit covers multi-band testing needs

Intelligent RF Architecture

Features "Wideband Coverage + High-Speed Processing" design: 9kHz-43.5GHz ultra-wideband analysis chain (Phase noise ≤-110dBc/Hz@40GHz, Estimated from VNA standards). 140dB ultra-high dynamic range enables weak signal detection (Minimum measurable power -120dBm, Product feature). Dedicated DSP processor achieves 4ms ultra-fast scanning (401-point scan time 8x faster than standard equipment, Core product feature). 98dB wide power sweep range supports high-dynamic device testing (Power accuracy ±0.5dB, Product feature).

RF Component Test Workflow

1. Connection: Direct connection to amplifiers/filters/etc.

2. Configuration: One-click test parameter setup, completed in 3 seconds

3. Scanning: Full-band 401-point scan in 4ms

4. Analysis: Auto-generates S-parameters/group delay reports

High-Frequency Measurement Boundary

Cable loss may cause ±1.8dB amplitude error when testing >40GHz (Estimated from mmWave test characteristics). Mitigation: ① Enable cable compensation algorithm (improves accuracy to ±0.4dB); ② Use ultra-low loss test cables (provided with rental).