

N5245B PNA-X Microwave Network Analyzer
Manufacturers
Keysight
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Ultimate Microwave Test Engine: Single-Connection Active Device Characterization
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Replaces entire test racks (Core product feature)
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Complete device characterization (Key benefit)
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Lab-grade accuracy (Technical advantage)
Hardware Feature | Capability | Application Value |
---|---|---|
Dual Signal Sources | Independent LO/RF generation | Enables mixer/converter testing without external equipment |
Integrated Pulse System | Modulators + generators | Radar component testing without additional instruments |
Multi-Receiver System | S-parameter + noise receivers | Simultaneous linear/nonlinear characterization |
Core Application Scenarios
Amplifier Validation — Simultaneous gain/noise/power characterization
Mixer Analysis — LO injection and conversion loss measurement
Radar Component Testing — Pulse profile and transient response
Integrated Test Architecture
Features "Multi-Engine Core" design: Dual internal sources with integrated combiner enable simultaneous LO/RF injection. Switch matrix routes signals to S-parameter receivers (0.1dB accuracy), noise figure receivers (±0.5dB uncertainty), and pulse measurement system (10ns resolution). Advanced error correction extends to nonlinear measurements (compression, IMD, harmonics).
Technical Dimension | PNA-X | Traditional Solution | Advantage |
---|---|---|---|
Test Setup | Single-connection | 5+ instrument connections | Reduces setup time by 80% |
Measurement Sync | Hardware-synchronized | Software-timed correlation | Ensures phase-coherent measurements |
Amplifier Test Workflow
Connection: Single cable to amplifier I/O ports
Configuration:
- Enable S-parameter + noise receivers
- Set source power: -30dBm to +20dBm
- Activate compression analysisTesting:
- Measure S21 gain and input match
- Characterize noise figure vs. bias
- Plot AM/PM compression curvesAnalysis: Generate comprehensive performance report
High-Power Measurement Boundary
Receiver damage risk at >+30dBm input. Mitigation: ① Use external attenuators for high-power DUTs; ② Enable automatic power limiting in test sequences.